CMOS Test and Evaluation A Physical Perspective /

This book extends test structure applications described in Microelectronic Test Struc­tures for CMOS Technology (Springer 2011) to digital CMOS product chips. Intended for engineering students and professionals, this book provides a single comprehensive source for evaluating CMOS technology and prod...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autores principales: Bhushan, Manjul (Autor), Ketchen, Mark B. (Autor)
Autor Corporativo: SpringerLink (Online service)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: New York, NY : Springer New York : Imprint: Springer, 2015.
Edición:1st ed. 2015.
Temas:
Electronics.
Electronic circuits.
Semiconductors.
Security systems.
Electronics and Microelectronics, Instrumentation.
Electronic Circuits and Systems.
Security Science and Technology.
Acceso en línea:Texto Completo

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