CMOS Test and Evaluation A Physical Perspective /
This book extends test structure applications described in Microelectronic Test Structures for CMOS Technology (Springer 2011) to digital CMOS product chips. Intended for engineering students and professionals, this book provides a single comprehensive source for evaluating CMOS technology and prod...
Clasificación: | Libro Electrónico |
---|---|
Autores principales: | Bhushan, Manjul (Autor), Ketchen, Mark B. (Autor) |
Autor Corporativo: | SpringerLink (Online service) |
Formato: | Electrónico eBook |
Idioma: | Inglés |
Publicado: |
New York, NY :
Springer New York : Imprint: Springer,
2015.
|
Edición: | 1st ed. 2015. |
Temas: | |
Acceso en línea: | Texto Completo |
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