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Robust SRAM Designs and Analysis

This book provides a guide to Static Random Access Memory (SRAM) bitcell design and analysis to meet the nano-regime challenges for CMOS devices and emerging devices, such as Tunnel FETs. Since process variability is an ongoing challenge in large memory arrays, this book highlights the most popular...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autores principales: Singh, Jawar (Autor), Mohanty, Saraju P. (Autor), Pradhan, Dhiraj K. (Autor)
Autor Corporativo: SpringerLink (Online service)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: New York, NY : Springer New York : Imprint: Springer, 2013.
Edición:1st ed. 2013.
Temas:
Acceso en línea:Texto Completo