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Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs
Since process variation and chip performance uncertainties have become more pronounced as technologies scale down into the nanometer regime, accurate and efficient modeling or characterization of variations from the device to the architecture level have become imperative for the successful design o...
| Clasificación: | Libro Electrónico |
|---|---|
| Autores principales: | , , |
| Autor Corporativo: | |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
New York, NY :
Springer New York : Imprint: Springer,
2012.
|
| Edición: | 1st ed. 2012. |
| Temas: | |
| Acceso en línea: | Texto Completo |
MARC
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| 001 | 978-1-4614-0788-1 | ||
| 003 | DE-He213 | ||
| 005 | 20220120005229.0 | ||
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| 020 | |a 9781461407881 |9 978-1-4614-0788-1 | ||
| 024 | 7 | |a 10.1007/978-1-4614-0788-1 |2 doi | |
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| 100 | 1 | |a Shen, Ruijing. |e author. |4 aut |4 http://id.loc.gov/vocabulary/relators/aut | |
| 245 | 1 | 0 | |a Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs |h [electronic resource] / |c by Ruijing Shen, Sheldon X.-D. Tan, Hao Yu. |
| 250 | |a 1st ed. 2012. | ||
| 264 | 1 | |a New York, NY : |b Springer New York : |b Imprint: Springer, |c 2012. | |
| 300 | |a XXX, 306 p. |b online resource. | ||
| 336 | |a text |b txt |2 rdacontent | ||
| 337 | |a computer |b c |2 rdamedia | ||
| 338 | |a online resource |b cr |2 rdacarrier | ||
| 347 | |a text file |b PDF |2 rda | ||
| 505 | 0 | |a Fundamentals of Statistical Analysis -- Statistical Full-Chip Leakage Power Analysis -- Statistical Full-Chip Dynamic Power Analysis -- Statistical Parasitic Extraction -- Statistical Compact Modeling and Reduction of Interconnects -- Statistical Analysis of Global Interconnects -- Statistical Analysis and Modeling for Analog and Mixed-Signal Circuits. | |
| 520 | |a Since process variation and chip performance uncertainties have become more pronounced as technologies scale down into the nanometer regime, accurate and efficient modeling or characterization of variations from the device to the architecture level have become imperative for the successful design of VLSI chips. This book provides readers with tools for variation-aware design methodologies and computer-aided design (CAD) of VLSI systems, in the presence of process variations at the nanometer scale. It presents the latest developments for modeling and analysis, with a focus on statistical interconnect modeling, statistical parasitic extractions, statistical full-chip leakage and dynamic power analysis considering spatial correlations, statistical analysis and modeling for large global interconnects and analog/mixed-signal circuits. Provides readers with timely, systematic and comprehensive treatments of statistical modeling and analysis of VLSI systems with a focus on interconnects, on-chip power grids and clock networks, and analog/mixed-signal circuits; Helps chip designers understand the potential and limitations of their design tools, improving their design productivity; Presents analysis of each algorithm with practical applications in the context of real circuit design; Includes numerical examples for the quantitative analysis and evaluation of algorithms presented. Provides readers with timely, systematic and comprehensive treatments of statistical modeling and analysis of VLSI systems with a focus on interconnects, on-chip power grids and clock networks, and analog/mixed-signal circuits; Helps chip designers understand the potential and limitations of their design tools, improving their design productivity; Presents analysis of each algorithm with practical applications in the context of real circuit design; Includes numerical examples for the quantitative analysis and evaluation of algorithms presented. . | ||
| 650 | 0 | |a Electronic circuits. | |
| 650 | 0 | |a Computer-aided engineering. | |
| 650 | 0 | |a Microtechnology. | |
| 650 | 0 | |a Microelectromechanical systems. | |
| 650 | 1 | 4 | |a Electronic Circuits and Systems. |
| 650 | 2 | 4 | |a Computer-Aided Engineering (CAD, CAE) and Design. |
| 650 | 2 | 4 | |a Microsystems and MEMS. |
| 700 | 1 | |a Tan, Sheldon X.-D. |e author. |4 aut |4 http://id.loc.gov/vocabulary/relators/aut | |
| 700 | 1 | |a Yu, Hao. |e author. |4 aut |4 http://id.loc.gov/vocabulary/relators/aut | |
| 710 | 2 | |a SpringerLink (Online service) | |
| 773 | 0 | |t Springer Nature eBook | |
| 776 | 0 | 8 | |i Printed edition: |z 9781489987877 |
| 776 | 0 | 8 | |i Printed edition: |z 9781461407898 |
| 776 | 0 | 8 | |i Printed edition: |z 9781461407874 |
| 856 | 4 | 0 | |u https://doi.uam.elogim.com/10.1007/978-1-4614-0788-1 |z Texto Completo |
| 912 | |a ZDB-2-ENG | ||
| 912 | |a ZDB-2-SXE | ||
| 950 | |a Engineering (SpringerNature-11647) | ||
| 950 | |a Engineering (R0) (SpringerNature-43712) | ||