Cargando…

Interfacial Compatibility in Microelectronics Moving Away from the Trial and Error Approach /

Interfaces between dissimilar materials are met everywhere in microelectronics and microsystems. In order to ensure faultless operation of these highly sophisticated structures, it is mandatory to have fundamental understanding of materials and their interactions in the system. In this difficult tas...

Descripción completa

Detalles Bibliográficos
Clasificación:Libro Electrónico
Autores principales: Laurila, Tomi (Autor), Vuorinen, Vesa (Autor), Paulasto-Kröckel, Mervi (Autor), Turunen, Markus (Autor), Mattila, Toni T. (Autor), Kivilahti, Jorma (Autor)
Autor Corporativo: SpringerLink (Online service)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: London : Springer London : Imprint: Springer, 2012.
Edición:1st ed. 2012.
Colección:Microsystems
Temas:
Acceso en línea:Texto Completo

Ejemplares similares