Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces

This thesis presents results from a combined atomic-resolution Z-contrast and annular bright-field imaging and electron energy loss spectroscopy in the Scanning Transmission Electron Microscopy, as well as first principles studies of the interfaces between crystalline β−Si3N4 and amorphous (i) CeO2-...

Descripción completa

Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor principal: Walkosz, Weronika (Autor)
Autor Corporativo: SpringerLink (Online service)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: New York, NY : Springer New York : Imprint: Springer, 2011.
Edición:1st ed. 2011.
Colección:Springer Theses, Recognizing Outstanding Ph.D. Research,
Temas:
Ceramic materials.
Spectrum analysis.
Physical chemistry.
Building materials.
Atomic structure  .
Molecular structure .
Microtechnology.
Microelectromechanical systems.
Ceramics.
Spectroscopy.
Physical Chemistry.
Structural Materials.
Atomic and Molecular Structure and Properties.
Microsystems and MEMS.
Acceso en línea:Texto Completo
Tabla de Contenidos:
  • Silicon Nitride Ceramics
  • Theoretical Methods and Approximations
  • Overview of Experimental Tools
  • Structural Energetics of β−Si3N4 (1010) Surfaces
  • Atomic Resolution Study of the Interfacial Bonding at SI3N4/CEO2−∂ Grain Boundaries
  • Atomic Resolution Study of β−Si3N4/ SIO2 Interfaces
  • Imagine Bulk α -SI3N4
  • Conclusions and Future Work
  • Appendices
  • Cited Literature.

Ejemplares similares