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Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces
This thesis presents results from a combined atomic-resolution Z-contrast and annular bright-field imaging and electron energy loss spectroscopy in the Scanning Transmission Electron Microscopy, as well as first principles studies of the interfaces between crystalline β−Si3N4 and amorphous (i) CeO2-...
| Clasificación: | Libro Electrónico |
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| Formato: | Electrónico eBook |
| Idioma: | Inglés |
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New York, NY :
Springer New York : Imprint: Springer,
2011.
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| Edición: | 1st ed. 2011. |
| Colección: | Springer Theses, Recognizing Outstanding Ph.D. Research,
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| Acceso en línea: | Texto Completo |