Reliability of Microtechnology Interconnects, Devices and Systems /

Reliability of Microtechnology discusses the reliability of microtechnology products from the bottom up, beginning with devices and extending to systems. The book's focus includes but is not limited to reliability issues of interconnects, the methodology of reliability concepts and general fail...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autores principales: Liu, Johan (Autor), Salmela, Olli (Autor), Sarkka, Jussi (Autor), Morris, James E. (Autor), Tegehall, Per-Erik (Autor), Andersson, Cristina (Autor)
Autor Corporativo: SpringerLink (Online service)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: New York, NY : Springer New York : Imprint: Springer, 2011.
Edición:1st ed. 2011.
Temas:
Electronics.
Optical materials.
Security systems.
Microtechnology.
Microelectromechanical systems.
Electronics and Microelectronics, Instrumentation.
Optical Materials.
Security Science and Technology.
Microsystems and MEMS.
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