Electron Backscatter Diffraction in Materials Science

Electron backscatter diffraction (EBSD), when employed as an additional characterization technique to a scanning electron microscope (SEM), enables individual grain orientations, local texture, point-to-point orientation correlations, and phase identification and distributions to be determined routi...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor Corporativo: SpringerLink (Online service)
Otros Autores: Schwartz, Adam J. (Editor ), Kumar, Mukul (Editor ), Adams, Brent L. (Editor ), Field, David P. (Editor )
Formato: Electrónico eBook
Idioma:Inglés
Publicado: New York, NY : Springer US : Imprint: Springer, 2009.
Edición:2nd ed. 2009.
Temas:
Materials-Analysis.
Materials science.
Condensed matter.
Geophysics.
Characterization and Analytical Technique.
Materials Science.
Condensed Matter Physics.
Acceso en línea:Texto Completo

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