Electron Backscatter Diffraction in Materials Science

Electron backscatter diffraction (EBSD), when employed as an additional characterization technique to a scanning electron microscope (SEM), enables individual grain orientations, local texture, point-to-point orientation correlations, and phase identification and distributions to be determined routi...

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Bibliographic Details
Call Number:Libro Electrónico
Corporate Author: SpringerLink (Online service)
Other Authors: Schwartz, Adam J. (Editor), Kumar, Mukul (Editor), Adams, Brent L. (Editor), Field, David P. (Editor)
Format: Electronic eBook
Language:Inglés
Published: New York, NY : Springer US : Imprint: Springer, 2009.
Edition:2nd ed. 2009.
Subjects:
Materials-Analysis.
Materials science.
Condensed matter.
Geophysics.
Characterization and Analytical Technique.
Materials Science.
Condensed Matter Physics.
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Internet

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