Nanometer Technology Designs High-Quality Delay Tests /

While adopting newer, better fabrication technologies provides higher integration and enhances performance, it also increases the types of manufacturing defects. With design size in millions of gates and working frequency in GHz, timing-related defects have become a high proportion of the total chip...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor principal: Ahmed, Nisar (Autor)
Autor Corporativo: SpringerLink (Online service)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: New York, NY : Springer US : Imprint: Springer, 2008.
Edición:1st ed. 2008.
Temas:
Electronic circuits.
Electronics.
Computer-aided engineering.
Nanotechnology.
Electrical engineering.
Electronic Circuits and Systems.
Electronics and Microelectronics, Instrumentation.
Computer-Aided Engineering (CAD, CAE) and Design.
Electrical and Electronic Engineering.
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