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Scanning Probe Microscopy Atomic Scale Engineering by Forces and Currents /
Scanning Probe Microscopy provides a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory. Written in the style of a textbook, it explains from scratch the theory behind today's simulation techniques and...
| Clasificación: | Libro Electrónico |
|---|---|
| Autores principales: | , |
| Autor Corporativo: | |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
New York, NY :
Springer New York : Imprint: Springer,
2006.
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| Edición: | 1st ed. 2006. |
| Colección: | NanoScience and Technology,
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| Temas: | |
| Acceso en línea: | Texto Completo |