Scanning Probe Microscopy Atomic Scale Engineering by Forces and Currents /

Scanning Probe Microscopy provides a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory. Written in the style of a textbook, it explains from scratch the theory behind today's simulation techniques and...

Descripción completa

Detalles Bibliográficos
Clasificación:Libro Electrónico
Autores principales: Foster, Adam (Autor), Hofer, Werner A. (Autor)
Autor Corporativo: SpringerLink (Online service)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: New York, NY : Springer New York : Imprint: Springer, 2006.
Edición:1st ed. 2006.
Colección:NanoScience and Technology,
Temas:
Materials-Analysis.
Nanotechnology.
Surfaces (Technology).
Thin films.
Atomic structure  .
Molecular structure .
Condensed matter.
Spectrum analysis.
Characterization and Analytical Technique.
Surfaces, Interfaces and Thin Film.
Atomic and Molecular Structure and Properties.
Condensed Matter Physics.
Spectroscopy.
Acceso en línea:Texto Completo

Internet

Texto Completo

Items no disponibles

Detalle de Existencias desde

Ejemplares similares