Scanning Probe Microscopy Electrical and Electromechanical Phenomena at the Nanoscale /

Scanning Probe Microscopy brings up to date a constantly growing knowledge base of electrical and electromechanical characterization at the nanoscale. This comprehensive, two-volume set presents practical and theoretical issues of advanced scanning probe microscopy (SPM) techniques ranging from fund...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autores principales: Kalinin, Sergei V. (Autor), Gruverman, Alexei (Autor)
Autor Corporativo: SpringerLink (Online service)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: New York, NY : Springer New York : Imprint: Springer, 2007.
Edición:1st ed. 2007.
Temas:
Materials > Analysis.
Nanotechnology.
Surfaces (Technology).
Thin films.
Biophysics.
Mechanical engineering.
Condensed matter.
Characterization and Analytical Technique.
Surfaces, Interfaces and Thin Film.
Bioanalysis and Bioimaging.
Mechanical Engineering.
Condensed Matter Physics.
Acceso en línea:Texto Completo
Tabla de Contenidos:
  • SPM Techniques for Electrical Characterization
  • Scanning Tunneling Potentiometry: The Power of STM applied to Electrical Transport
  • Probing Semiconductor Technology and Devices with Scanning Spreading Resistance Microscopy
  • Scanning Capacitance Microscopy for Electrical Characterization of Semiconductors and Dielectrics
  • Principles of Kelvin Probe Force Microscopy
  • Frequency-Dependent Transport Imaging by Scanning Probe Microscopy
  • Review of Ferroelectric Domain Imaging by Piezoresponse Force Microscopy
  • Principles of Near-Field Microwave Microscopy
  • Electromagnetic Singularities and Resonances in Near-Field Optical Probes
  • Electrochemical SPM
  • Near-Field High-Frequency Probing
  • Electrical and Electromechanical Imaging at the Limits of Resolution
  • Scanning Probe Microscopy on Low-Dimensional Electron Systems in III-V Semiconductors
  • Spin-Polarized Scanning Tunneling Microscopy
  • Scanning Probe Measurements of Electron Transport in Molecules
  • Scanning Probe Microscopy of Individual Carbon Nanotube Quantum Devices
  • Conductance AFM Measurements of Transport Through Nanotubes and Nanotube Networks
  • Theory of Scanning Probe Microscopy
  • Multi-Probe Scanning Tunneling Microscopy
  • Dynamic Force Microscopy and Spectroscopy in Vacuum
  • Scanning Tunneling Microscopy and Spectroscopy of Manganites
  • Electrical SPM Characterization of Materials and Devices
  • Scanning Voltage Microscopy
  • Electrical Scanning Probe Microscopy of Biomolecules on Surfaces and at Interfaces
  • Electromechanical Behavior in Biological Systems at the Nanoscale
  • Scanning Capacitance Microscopy
  • Kelvin Probe Force Microscopy of Semiconductors
  • Nanoscale Characterization of Electronic and Electrical Properties of III-Nitrides by Scanning Probe Microscopy
  • Electron Flow Through Molecular Structures
  • Electrical Characterization of Perovskite Nanostructures by SPM
  • SPM Measurements of Electric Properties of Organic Molecules
  • High-Sensitivity Electric Force Microscopy of Organic Electronic Materials and Devices
  • Electrical Nanofabrication
  • Electrical SPM-Based Nanofabrication Techniques
  • Fundamental Science and Lithographic Applications of Scanning Probe Oxidation
  • UHV-STM Nanofabrication on Silicon
  • Ferroelectric Lithography
  • Patterned Self-Assembled Monolayers via Scanning Probe Lithography
  • Resistive Probe Storage: Read/Write Mechanism.

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