Scanning Probe Microscopy Electrical and Electromechanical Phenomena at the Nanoscale /

Scanning Probe Microscopy brings up to date a constantly growing knowledge base of electrical and electromechanical characterization at the nanoscale. This comprehensive, two-volume set presents practical and theoretical issues of advanced scanning probe microscopy (SPM) techniques ranging from fund...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autores principales: Kalinin, Sergei V. (Autor), Gruverman, Alexei (Autor)
Autor Corporativo: SpringerLink (Online service)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: New York, NY : Springer New York : Imprint: Springer, 2007.
Edición:1st ed. 2007.
Temas:
Materials > Analysis.
Nanotechnology.
Surfaces (Technology).
Thin films.
Biophysics.
Mechanical engineering.
Condensed matter.
Characterization and Analytical Technique.
Surfaces, Interfaces and Thin Film.
Bioanalysis and Bioimaging.
Mechanical Engineering.
Condensed Matter Physics.
Acceso en línea:Texto Completo

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