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Scanning Probe Microscopy Electrical and Electromechanical Phenomena at the Nanoscale /
Scanning Probe Microscopy brings up to date a constantly growing knowledge base of electrical and electromechanical characterization at the nanoscale. This comprehensive, two-volume set presents practical and theoretical issues of advanced scanning probe microscopy (SPM) techniques ranging from fund...
| Clasificación: | Libro Electrónico |
|---|---|
| Autores principales: | , |
| Autor Corporativo: | |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
New York, NY :
Springer New York : Imprint: Springer,
2007.
|
| Edición: | 1st ed. 2007. |
| Temas: | |
| Acceso en línea: | Texto Completo |
MARC
| LEADER | 00000nam a22000005i 4500 | ||
|---|---|---|---|
| 001 | 978-0-387-28668-6 | ||
| 003 | DE-He213 | ||
| 005 | 20230810135842.0 | ||
| 007 | cr nn 008mamaa | ||
| 008 | 100301s2007 xxu| s |||| 0|eng d | ||
| 020 | |a 9780387286686 |9 978-0-387-28668-6 | ||
| 024 | 7 | |a 10.1007/978-0-387-28668-6 |2 doi | |
| 050 | 4 | |a TA418.5-.84 | |
| 072 | 7 | |a TGMT |2 bicssc | |
| 072 | 7 | |a TEC021000 |2 bisacsh | |
| 072 | 7 | |a TGMT |2 thema | |
| 082 | 0 | 4 | |a 620.112 |2 23 |
| 100 | 1 | |a Kalinin, Sergei V. |e author. |4 aut |4 http://id.loc.gov/vocabulary/relators/aut | |
| 245 | 1 | 0 | |a Scanning Probe Microscopy |h [electronic resource] : |b Electrical and Electromechanical Phenomena at the Nanoscale / |c by Sergei V. Kalinin, Alexei Gruverman. |
| 250 | |a 1st ed. 2007. | ||
| 264 | 1 | |a New York, NY : |b Springer New York : |b Imprint: Springer, |c 2007. | |
| 300 | |a XL, 980 p. 365 illus., 15 illus. in color. |b online resource. | ||
| 336 | |a text |b txt |2 rdacontent | ||
| 337 | |a computer |b c |2 rdamedia | ||
| 338 | |a online resource |b cr |2 rdacarrier | ||
| 347 | |a text file |b PDF |2 rda | ||
| 505 | 0 | |a SPM Techniques for Electrical Characterization -- Scanning Tunneling Potentiometry: The Power of STM applied to Electrical Transport -- Probing Semiconductor Technology and Devices with Scanning Spreading Resistance Microscopy -- Scanning Capacitance Microscopy for Electrical Characterization of Semiconductors and Dielectrics -- Principles of Kelvin Probe Force Microscopy -- Frequency-Dependent Transport Imaging by Scanning Probe Microscopy -- Review of Ferroelectric Domain Imaging by Piezoresponse Force Microscopy -- Principles of Near-Field Microwave Microscopy -- Electromagnetic Singularities and Resonances in Near-Field Optical Probes -- Electrochemical SPM -- Near-Field High-Frequency Probing -- Electrical and Electromechanical Imaging at the Limits of Resolution -- Scanning Probe Microscopy on Low-Dimensional Electron Systems in III-V Semiconductors -- Spin-Polarized Scanning Tunneling Microscopy -- Scanning Probe Measurements of Electron Transport in Molecules -- Scanning Probe Microscopy of Individual Carbon Nanotube Quantum Devices -- Conductance AFM Measurements of Transport Through Nanotubes and Nanotube Networks -- Theory of Scanning Probe Microscopy -- Multi-Probe Scanning Tunneling Microscopy -- Dynamic Force Microscopy and Spectroscopy in Vacuum -- Scanning Tunneling Microscopy and Spectroscopy of Manganites -- Electrical SPM Characterization of Materials and Devices -- Scanning Voltage Microscopy -- Electrical Scanning Probe Microscopy of Biomolecules on Surfaces and at Interfaces -- Electromechanical Behavior in Biological Systems at the Nanoscale -- Scanning Capacitance Microscopy -- Kelvin Probe Force Microscopy of Semiconductors -- Nanoscale Characterization of Electronic and Electrical Properties of III-Nitrides by Scanning Probe Microscopy -- Electron Flow Through Molecular Structures -- Electrical Characterization of Perovskite Nanostructures by SPM -- SPM Measurements of Electric Properties of Organic Molecules -- High-Sensitivity Electric Force Microscopy of Organic Electronic Materials and Devices -- Electrical Nanofabrication -- Electrical SPM-Based Nanofabrication Techniques -- Fundamental Science and Lithographic Applications of Scanning Probe Oxidation -- UHV-STM Nanofabrication on Silicon -- Ferroelectric Lithography -- Patterned Self-Assembled Monolayers via Scanning Probe Lithography -- Resistive Probe Storage: Read/Write Mechanism. | |
| 520 | |a Scanning Probe Microscopy brings up to date a constantly growing knowledge base of electrical and electromechanical characterization at the nanoscale. This comprehensive, two-volume set presents practical and theoretical issues of advanced scanning probe microscopy (SPM) techniques ranging from fundamental physical studies to device characterization, failure analysis, and nanofabrication. Volume 1 focuses on the technical aspects of SPM methods ranging from scanning tunneling potentiometry to electrochemical SPM, and addresses the fundamental physical phenomena underlying the SPM imaging mechanism. Volume 2 concentrates on the practical aspects of SPM characterization of a wide range of materials, including semiconductors, ferroelectrics, dielectrics, polymers, carbon nanotubes, and biomolecules, as well as on SPM-based approaches to nanofabrication and nanolithography. | ||
| 650 | 0 | |a Materials |x Analysis. | |
| 650 | 0 | |a Nanotechnology. | |
| 650 | 0 | |a Surfaces (Technology). | |
| 650 | 0 | |a Thin films. | |
| 650 | 0 | |a Biophysics. | |
| 650 | 0 | |a Mechanical engineering. | |
| 650 | 0 | |a Condensed matter. | |
| 650 | 1 | 4 | |a Characterization and Analytical Technique. |
| 650 | 2 | 4 | |a Nanotechnology. |
| 650 | 2 | 4 | |a Surfaces, Interfaces and Thin Film. |
| 650 | 2 | 4 | |a Bioanalysis and Bioimaging. |
| 650 | 2 | 4 | |a Mechanical Engineering. |
| 650 | 2 | 4 | |a Condensed Matter Physics. |
| 700 | 1 | |a Gruverman, Alexei. |e author. |4 aut |4 http://id.loc.gov/vocabulary/relators/aut | |
| 710 | 2 | |a SpringerLink (Online service) | |
| 773 | 0 | |t Springer Nature eBook | |
| 776 | 0 | 8 | |i Printed edition: |z 9780387509341 |
| 776 | 0 | 8 | |i Printed edition: |z 9780387286679 |
| 776 | 0 | 8 | |i Printed edition: |z 9781493950362 |
| 856 | 4 | 0 | |u https://doi.uam.elogim.com/10.1007/978-0-387-28668-6 |z Texto Completo |
| 912 | |a ZDB-2-CMS | ||
| 912 | |a ZDB-2-SXC | ||
| 950 | |a Chemistry and Materials Science (SpringerNature-11644) | ||
| 950 | |a Chemistry and Material Science (R0) (SpringerNature-43709) | ||