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Fault Diagnosis of Analog Integrated Circuits

System on Chip (SOC) having both digital and analog circuits has become increasingly prevalent in integrated circuit manufacturing industry. Electronic tests are classified as digital, analog and mixed signal. Current methodologies for the testing of digital circuits are well developed. In contrast,...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autores principales: Kabisatpathy, Prithviraj (Autor), Barua, Alok (Autor), Sinha, Satyabroto (Autor)
Autor Corporativo: SpringerLink (Online service)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: New York, NY : Springer US : Imprint: Springer, 2005.
Edición:1st ed. 2005.
Colección:Frontiers in Electronic Testing ; 30
Temas:
Acceso en línea:Texto Completo