Ma, S., & Jin, Y. (2022). TSV 3D RF integration: High resistivity Si interposer technology. Elsevier.
Cita Chicago Style (17a ed.)Ma, Shenglin, y Yufeng Jin. TSV 3D RF Integration: High Resistivity Si Interposer Technology. Amsterdam, Netherlands: Elsevier, 2022.
Cita MLA (8a ed.)Ma, Shenglin, y Yufeng Jin. TSV 3D RF Integration: High Resistivity Si Interposer Technology. Elsevier, 2022.
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