Fundamentals and Applications of Nano Silicon in Plasmonics and Fullerines : Current and Future Trends /

"Fundamentals and Applications of Nano Silicon in Plasmonics and Fullerines: Current and Future Trends addresses current and future trends in the application and commercialization of nanosilicon. The book presents current, innovative and prospective applications and products based on nanosilico...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor principal: Nayfeh, Munir H. (Munir Hasan) (Autor)
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Amsterdam, Netherlands : Elsevier, [2018]
Colección:Micro & nano technologies.
Temas:
Nanosilicon.
Plasmonics.
Fullerenes.
Nanosilicium.
Fuller�enes.
TECHNOLOGY & ENGINEERING > Engineering (General)
TECHNOLOGY & ENGINEERING > Reference.
Acceso en línea:Texto completo
Tabla de Contenidos:
  • Cover; Title page; Copyright page; Contents; Preface; Chapter 1
  • Atom-by-Atom Manufacturing: The Birth of Nanotechnology; 1.1
  • Feynman's vision; 1.2
  • Feynman challenge funding; 1.3
  • Drawbacks of atom-by-atom (ABA); 1.4
  • Parallel manufacturing solution by K. Eric Drexler; References; Further Readings; Chapter 2
  • Seeing and Detecting Atoms in a Gas Using Light; 2.1
  • Picking stationary atoms with laser light; 2.2
  • Counting sodium atoms using resonance light (fluorescence) spectroscopy; 2.3
  • Detection of single atoms using light-induced electron resonance ionization
  • 2.3.1
  • Stopping/Cooling Atoms2.3.2
  • Atom-by-Atom Fabrication; References; Chapter 3
  • Trapping and Stopping/Cooling of Atoms, Particles, and Bio-components Using Laser Light; 3.1
  • Solar and laser sails; 3.2
  • Stopping atoms: atom trap (magneto-optical trap); 3.3
  • Trapping nano- to micro-particles (push-pull forces); 3.4
  • Trapping of ultrasmall nanoparticles: nano (trap) tweezers; 3.4.1
  • Higher NA; 3.4.2
  • Plasmonic (Metal) Nanolenses; 3.5
  • Thermal trapping of particles; References; Chapter 4
  • Seeing Atoms and Clusters onSurfaces
  • 4.1
  • Seeing nanoparticles and what's inside with free electrons4.1.1 Transmission Electron Microscope (TEM); 4.2
  • Seeing atoms, molecules, and nanoparticles on surfaces using tunneling electrons (STM Imaging); 4.2.1
  • Nanoparticles; 4.2.2 Spectroscopy Using Tunneling Scanning (STS): I-V Spectroscopy; 4.3
  • Mechanical atomic imaging (atomic force microscope
  • AFM); 4.3.1 Imaging Nanoparticles; 4.4
  • Unveiling the surface topography: the oscillating cantilever; 4.5
  • Variety of tip-based imaging; 4.5.1 Conductive AFM (CAFM); 4.5.2 AFM Tip with Single Molecule Apex
  • 4.5.3 Magnetic Force Microscopy4.5.4 Near-Field Scanning Optical Microscopy (NSOM); 4.5.5 Scanning Electrochemical Microscopy (SECM) Ultra-Microelectrode (UME) Tip; 4.6
  • Tip preparation and effect of shape; 4.6.1 Metal Tips for STM; 4.6.2 Platinum-Iridium or Gold Tips; 4.6.3 Multiple Whisker Tips; 4.6.4 Solid Carbon Cone Tapping Mode; 4.6.5 Metal-Coated Silicon AFM Tips; 4.6.6 Carbon Nanotube Tips; References; Chapter 5
  • Manipulation and Patterning of Surfaces (Nanolithography); 5.1
  • Standard visible and near UV photolithography; 5.2
  • Current photolithography (shorter wavelength)
  • 5.2.1
  • Wavelength-Independent Resolution5.2.2
  • Immersion Lithography; 5.2.2.1
  • Double Patterning: Increasing Feature Density; 5.3
  • New generation of lithography (NGL); 5.3.1
  • Extreme Ultraviolet Lithography (EUV-Lithography); 5.3.2
  • X-Ray Lithography; 5.3.3
  • Electron-Beam Lithography; 5.3.4
  • Focused Ion Beam (FIB) Lithography; 5.4
  • Variety of non-conventional lithography; 5.4.1
  • Nanoimprint (Mold) Lithography; 5.4.2
  • Plasmonic-Assisted Lithography; 5.4.2.1
  • Plasmonic Hyperlens-Based Lithography; 5.4.3
  • Laser Interference Lithography; 5.4.4
  • Nanosphere Shadow Lithography
  • 5.4.5
  • Resists

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