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Defects in Advanced Electronic Materials and Novel Low Dimensional Structures /

"Defects in Advanced Electronic Materials and Novel Low Dimensional Structures provides a comprehensive review on the recent progress in solving defect issues and deliberate defect engineering in novel material systems. It begins with an overview of point defects in ZnO and group-III nitrides,...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Otros Autores: Chen, Weimin (Editor ), Stehr, Jan (Editor ), Buyanova, Irina (Editor )
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Duxford, United Kingdom : Woodhead Publishing, an imprint of Elsevier, [2018]
Colección:Woodhead Publishing series in electronic and optical materials
Temas:
Acceso en línea:Texto completo

MARC

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245 0 0 |a Defects in Advanced Electronic Materials and Novel Low Dimensional Structures /  |c edited by Jan Stehr, Irina Buyanova, Weimin Chen. 
264 1 |a Duxford, United Kingdom :  |b Woodhead Publishing, an imprint of Elsevier,  |c [2018] 
264 4 |c �2018 
300 |a 1 online resource 
336 |a text  |b txt  |2 rdacontent 
337 |a computer  |b c  |2 rdamedia 
338 |a online resource  |b cr  |2 rdacarrier 
490 0 |a Woodhead Publishing series in electronic and optical materials 
588 |a Online resource; title from PDF title page (EBSCO, viewed June 21, 2018). 
504 |a Includes bibliographical references and index. 
520 |a "Defects in Advanced Electronic Materials and Novel Low Dimensional Structures provides a comprehensive review on the recent progress in solving defect issues and deliberate defect engineering in novel material systems. It begins with an overview of point defects in ZnO and group-III nitrides, including irradiation-induced defects, and then look at defects in one and two-dimensional materials, including carbon nanotubes and graphene. Next, it examines the ways that defects can expand the potential applications of semiconductors, such as energy upconversion and quantum processing. The book concludes with a look at the latest advances in theory. While defect physics is extensively reviewed for conventional bulk semiconductors, the same is far from being true for novel material systems, such as low-dimensional 1D and 0D nanostructures and 2D monolayers. This book fills that necessary gap. Presents an in-depth overview of both conventional bulk semiconductors and low-dimensional, novel material systems, such as 1D structures and 2D monolayersAddresses a range of defects in a variety of systems, providing a comparative approachIncludes sections on advances in theory that provide insights on where this body of research might lead"--  |c Provided by publisher 
650 0 |a Smart materials  |x Defects. 
650 0 |a Nanostructured materials  |x Defects. 
650 6 |a Mat�eriaux intelligents  |0 (CaQQLa)201-0230163  |x D�efauts.  |0 (CaQQLa)201-0373897 
650 6 |a Nanomat�eriaux  |0 (CaQQLa)201-0258061  |x D�efauts.  |0 (CaQQLa)201-0373897 
650 7 |a TECHNOLOGY & ENGINEERING  |x Engineering (General)  |2 bisacsh 
650 7 |a TECHNOLOGY & ENGINEERING  |x Reference.  |2 bisacsh 
700 1 |a Chen, Weimin,  |e editor. 
700 1 |a Stehr, Jan,  |e editor. 
700 1 |a Buyanova, Irina,  |e editor. 
776 0 8 |i Print version:  |z 0081020538  |z 9780081020531  |w (OCoLC)1011515167 
856 4 0 |u https://sciencedirect.uam.elogim.com/science/book/9780081020531  |z Texto completo