MARC

LEADER 00000cam a2200000 i 4500
001 SCIDIR_ocn893872998
003 OCoLC
005 20231120111841.0
006 m o d
007 cr cnu---unuuu
008 141027s1984 nyua ob 001 0 eng d
040 |a OPELS  |b eng  |e rda  |e pn  |c OPELS  |d N$T  |d YDXCP  |d EBLCP  |d DEBSZ  |d OCLCQ  |d UAB  |d OCLCQ  |d MERUC  |d STF  |d OCLCQ  |d OCLCO  |d OCLCQ  |d OCLCO 
019 |a 897651981 
020 |a 9781483217758  |q (electronic bk.) 
020 |a 1483217752  |q (electronic bk.) 
020 |z 0122341082 
020 |z 9780122341083 
035 |a (OCoLC)893872998  |z (OCoLC)897651981 
050 4 |a TK7874  |b .V56 v.8, 1984eb 
072 7 |a TEC  |x 009070  |2 bisacsh 
082 0 4 |a 621.381/73  |2 22 
245 0 0 |a Plasma processing for VLSI /  |c edited by Norman G. Einspruch, Dale M. Brown. 
264 1 |a New York :  |b Academic Press,  |c 1984. 
300 |a 1 online resource (xiv, 527 pages) :  |b illustrations 
336 |a text  |b txt  |2 rdacontent 
337 |a computer  |b c  |2 rdamedia 
338 |a online resource  |b cr  |2 rdacarrier 
490 1 |a VLSI electronics ;  |v volume 8 
504 |a Includes bibliographical references and index. 
588 0 |a Print version record. 
505 0 |a Front Cover; Plasma Processing forVLSI; Copyright Page; Table of Contents; List of Contributors; Preface; Chapter 1. The History of Plasma Processing; I. INTRODUCTION; II. EARLY DEVELOPMENTS; III. INTRODUCTION OF PLASMA PROCESSING TOSEMICONDUCTOR MANUFACTURING, 1971-1978; IV. FULL-SCALE COMMITMENT TO DRY-PROCESSTECHNOLOGY, 1978-1983; V. CHALLENGES AND OPPORTUNITIES FOR PLASMATECHNOLOGY, 1983-1988; REFERENCES; Part A: Deposition; Chapter 2. Sputtering for VLSI; I. INTRODUCTION; II. CONTACT METALLIZATION; III. DIFFUSION BARRIERS; IV. SCHOTTKY DIODE METALLIZATION; V. COSPUTTERED ALUMINUM ALLOYS. 
505 8 |a VI. REFRACTORY SILICIDES IN GATE METALLIZATIONVII. FILM STRESS; VIII. DIELECTRICS; IX. DIE ATTACH; X. SUMMARY AND FUTURE DIRECTIONS; REFERENCES; Chapter 3. Plasma-Enhanced Chemical Vapor Deposition of Transition Metalsand Transition MetalSuicides; I. INTRODUCTION; II. PLASMA-ENHANCED DEPOSITION; III. SUMMARY; ACKNOWLEDGMENTS; REFERENCES; Chapter 4. Plasma-Enhanced Chemical Vapor Depositionof Dielectrics; 1. INTRODUCTION; II. GENERAL PRINCIPLES; III. SPECIFIC MATERIALS; IV. EQUIPMENT FOR PECVD OF INORGANIC DIELECTRICS; V. SUMMARY; REFERENCES; Part B: Lithography; Chapter 5. Trilayer Resist. 
505 8 |a I. INTRODUCTIONII. PLASMA PROCESSING; III. LIMITATIONS OF SINGLE-LAYER RESIST; IV. FORMATION OF THE PROCESS ETCH MASK; V. UTILIZATION OF THE PROCESS MASK; VI. OPTIONS TO TRILAYER RESIST; VII. SUMMARY; ACKNOWLEDGMENTS; REFERENCES; Chapter 6. Plasma Sourcesfor X-Ray Lithography; I. INTRODUCTION; II. X-RAY LITHOGRAPHY; III. X-RAY SOURCE REQUIREMENTS; IV. ELECTRON-IMPACT X-RAY SOURCES; V. SYNCHROTRON X-RADIATION SOURCES; VI. PLASMA X-RAY SOURCES; VII. CONCLUSION; APPENDIX. X-RAY SOURCE CHARACTERIZATION; ACKNOWLEDGMENTS; REFERENCES; Chapter 7. Plasma Sourcesfor Deep-UV Lithography; I. INTRODUCTION. 
505 8 |a II. GENERAL REQUIREMENTS FOR DEEP-UVLITHOGRAPHIC SOURCESIII. DESCRIPTION OF SOURCES; IV. CONCLUSIONS; REFERENCES; Part C: Etching; Chapter 8. Basic Principles of Plasma Etchingfor Silicon Devices; I. INTRODUCTION; II. PRINCIPLE OF ISOTROPIC AND ANISOTROPIC ETCHING; III. PLASMA AND SURFACE CHEMISTRY; IV. SELECTIVITY IN PLASMA ETCHING; V. ETCHING IN PLASMAS THAT PRODUCE FREE FLUORINE; VI. ETCHING OF ORGANIC MATERIAL IN OXYGEN-BASEDPLASMAS; VII. ETCHING IN PLASMAS THAT PRODUCEFLUOROCARBON RADICALS; VIII. ETCHING IN PLASMAS THAT PRODUCE CHLORINE ANDBROMINE ATOMS; IX. HYDROGEN PLASMA ETCHING. 
505 8 |a ACKNOWLEDGMENTREFERENCES; Chapter 9. High-Pressure Etching; NOMENCLATURE; I. INTRODUCTION; II. EQUIPMENT; III. PLASMA PROPERTIES; IV. PROCESSES FOR SPECIFIC MATERIALS; V. CONCLUSIONS; ACKNOWLEDGMENTS; REFERENCES; Chapter 10. Reactive Ion Etching; I. INTRODUCTION; II. GENERAL PRINCIPLES; III. PROCESS PARAMETER EFFECTS; IV. SPECIFIC MATERIALS AND STRUCTURES; V. EQUIPMENT CONSIDERATIONS; VI. SUMMARY; ACKNOWLEDGMENTS; REFERENCES; Chapter 11. Ion-Beam Etching (Milling; I. INTRODUCTION; II. PHYSICS OF ION-BEAM ETCHING; III. TECHNIQUES AND PROBLEMS OF ION-BEAM ETCHING; IV. APPLICATIONS. 
520 |a Plasma Processing for VLSI. 
650 0 |a Integrated circuits  |x Very large scale integration. 
650 0 |a Plasma (Ionized gases)  |x Industrial applications. 
650 6 |a Circuits int�egr�es �a tr�es grande �echelle.  |0 (CaQQLa)201-0117255 
650 6 |a Plasma (Gaz ionis�es)  |0 (CaQQLa)201-0008600  |x Applications industrielles.  |0 (CaQQLa)201-0374039 
650 7 |a TECHNOLOGY & ENGINEERING  |x Mechanical.  |2 bisacsh 
650 7 |a Integrated circuits  |x Very large scale integration  |2 fast  |0 (OCoLC)fst00975602 
650 7 |a Plasma (Ionized gases)  |x Industrial applications  |2 fast  |0 (OCoLC)fst01066270 
650 7 |a Gravure par plasma.  |2 ram 
650 7 |a Lithographie par rayons X.  |2 ram 
650 7 |a Pulv�erisation cathodique.  |2 ram 
650 7 |a Circuits int�egr�es �a tr�es grande �echelle.  |2 ram 
700 1 |a Einspruch, Norman G. 
700 1 |a Brown, Dale M. 
776 0 8 |i Print version:  |t Plasma processing for VLSI  |z 0122341082  |w (DLC) 83022351  |w (OCoLC)10995615 
830 0 |a VLSI electronics ;  |v v. 8. 
856 4 0 |u https://sciencedirect.uam.elogim.com/science/book/9780122341083  |z Texto completo 
856 4 0 |u https://sciencedirect.uam.elogim.com/science/bookseries/07367031/8  |z Texto completo