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Advances in optical and electron microscopy. Volume 12 /
The volumes in this series cover the progress and innovation in optical and electron microscopy at a fundamental level. It is aimed at microscopists and researchers not only interested in microscope instrumentation but also in applications ranging from biological techniques to materials research and...
| Clasificación: | Libro Electrónico |
|---|---|
| Otros Autores: | , |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
London :
Academic Press,
1991.
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| Temas: | |
| Acceso en línea: | Texto completo |
Tabla de Contenidos:
- Front Cover; Advances in Optical and Electron Microscopy; Copyright Page ; Contributors; Preface; Table of Contents; Chapter 1. The Invention of the Electron Fresnel Interference Biprism; I. Childhood years in Bielefeld; II. Gaining technical know-how as a student apprentice; III. A broad education in physics with Professor Walter Kossel; IV. Influence of the work of kikuchi and convergent beam diffraction; V. Electron-optical experiments with Br�uche, Scherzer and Mahl; VI. Quantitative testing of the operation of the biprism; VII. Measurement of the inner potential of solids.
- VIII. Electron interference microscope in the transmission modeIX. The intensity problem in electron interferometers; X. Atomic resolution electron holography; Chapter 2. Electron Image Plane Off-axis Holography of Atomic Structures; I. Introduction; II. Principles of off-axis image plane electron holography; III. Performance of image plane electron holography; IV. Influence of the lens aberrations in the high-resolution domain; V. Reconstruction of the image wave and correction of aberrations; VI. Experimental realization of holography of atomic structures; VII. Conclusion; References.
- Chapter 3. Magnetic Through-the-lens Detection in Electron Microscopy and Spectroscopy, Part 1I. Introduction; II. Historical development of through-the-lens detection; III. Historical development of the magnetic parallelizer for spectroscopy applications; IV. Theory of adiabatic motion; V. Summary; References; Chapter 4. Advances in Voltage-Contrast Detectors in Scanning Electron Microscopes; I. Introduction; II. Test techniques for integrated circuits; III. Secondary electrons; IV. Voltage-contrast detectors; V. Design of a double channel spectrometer; VI. Measurements.
- VII. Future developmentsVIII. Conclusions; IX. List of symbols; Acknowledgements; References; Chapter 5. Scanning Near-field Optical Microscopy (SNOM); I. Introduction; II. Historical background; III. Theoretical background; IV. Experimental work; V. DISCUSSION; Acknowledgements; References; Chapter 6. Microscopic Thermal Wave Non-destructive Testing; I. Introduction; II. Thermal waves and their generation; III. The resolution of the thermal wave microscope; IV. Photothermal NDE techniques with periodic heating; V. Photothermal pulse and scanning methods; VI. Experimental pulse techniques.
- VII. ConclusionReferences; INDEX.