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Hybrid microcircuit reliability data /

Hybrid Microcircuit Reliability Data provides test and operational data on the hybrid device in both highly summarized and detailed format. Organized into five sections, this book begins with a comparison of hybrid device users' experienced failure rate with predicted failure rate. Subsequent c...

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Détails bibliographiques
Cote:Libro Electrónico
Collectivité auteur: IIT Research Institute
Format: Électronique eBook
Langue:Inglés
Publié: Oxford ; New York : Pergamon Press, 1976.
Sujets:
Accès en ligne:Texto completo