Symposium D on Diagnostic Techniques for Semiconductor Materials Analysis and Fabrication Process Control Strasbourg, France, European Materials Research Society, Crean, G. M., Stuck, R., & Woollam, J. A. (1993). Semiconductor materials analysis and fabrication process control: Proceedings of Symposium D on Diagnostic Techniques for Semiconductor Materials Analysis and Fabrication Process Control of the 1992 E-MRS Spring Conference, Strasbourg, France, June 2-5, 1992. North-Holland.
Cita Chicago Style (17a ed.)Symposium D on Diagnostic Techniques for Semiconductor Materials Analysis and Fabrication Process Control Strasbourg, France, European Materials Research Society, G. M. Crean, R. Stuck, y John A. Woollam. Semiconductor Materials Analysis and Fabrication Process Control: Proceedings of Symposium D on Diagnostic Techniques for Semiconductor Materials Analysis and Fabrication Process Control of the 1992 E-MRS Spring Conference, Strasbourg, France, June 2-5, 1992. Amsterdam: North-Holland, 1993.
Cita MLA (8a ed.)Symposium D on Diagnostic Techniques for Semiconductor Materials Analysis and Fabrication Process Control Strasbourg, France, et al. Semiconductor Materials Analysis and Fabrication Process Control: Proceedings of Symposium D on Diagnostic Techniques for Semiconductor Materials Analysis and Fabrication Process Control of the 1992 E-MRS Spring Conference, Strasbourg, France, June 2-5, 1992. North-Holland, 1993.