Ion beams for materials analysis /

The use of ion beams for materials analysis involves many different ion-atom interaction processes which previously have largely been considered in separate reviews and texts. A list of books and conference proceedings is given in Table 2. This book is divided into three parts, the first which treat...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Otros Autores: Bird, J. R., Williams, James S. (James Stanislaus), 1948-
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Sydney ; San Diego : Academic Press, �1989.
Temas:
Ion bombardment.
Materials > Analysis.
Bombardement ionique.
Mat�eriaux > Analyse.
SCIENCE > Physics > Nuclear.
Ion bombardment
Materials > Analysis
Ionenstrahl
Sekund�arionen-Massenspektrometrie
Werkstoffpr�ufung
Acceso en línea:Texto completo
Tabla de Contenidos:
  • Concepts and principles of ion beam analysis / J.S. Williams and J.R. Bird
  • Techniques and equipment / M.J. Kenny
  • High energy ion scattering spectrometry / J.E.E. Baglin and J.S. Williams
  • Nuclear reactions / J.R. Bird
  • Ion induced X-ray emission / D.D. Cohen and E. Clayton
  • Channeling / J.S. Williams and R.G. Elliman
  • Depth profiling of surface layers during ion bombardment / R.J. MacDonald and B.V. King
  • Low energy ion scattering from surfaces / D.J. O'Connor and R.J. MacDonald
  • Ion scattering from surfaces and interfaces / L.C. Feldman
  • Microprobe analysis / G.J.F. Legge
  • Critical assessment of analysis capabilities / J.R. Bird and J.S. Williams
  • General methods / J.R. Bird and J.S. Williams
  • Directory of materials / L. Wielunski, J.R. Bird and J.S. Williams
  • Data lists / J.R. Bird et al.

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