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Ion beams for materials analysis /
The use of ion beams for materials analysis involves many different ion-atom interaction processes which previously have largely been considered in separate reviews and texts. A list of books and conference proceedings is given in Table 2. This book is divided into three parts, the first which treat...
| Clasificación: | Libro Electrónico |
|---|---|
| Otros Autores: | , |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
Sydney ; San Diego :
Academic Press,
�1989.
|
| Temas: | |
| Acceso en línea: | Texto completo |
MARC
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|---|---|---|---|
| 001 | SCIDIR_ocn838123966 | ||
| 003 | OCoLC | ||
| 005 | 20231117044846.0 | ||
| 006 | m o d | ||
| 007 | cr cnu---unuuu | ||
| 008 | 130411s1989 xnaa ob 001 0 eng d | ||
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| 019 | |a 1162076894 |a 1200488794 | ||
| 020 | |a 9780080916897 |q (electronic bk.) | ||
| 020 | |a 0080916899 |q (electronic bk.) | ||
| 020 | |z 0120997401 | ||
| 020 | |z 9780120997404 | ||
| 035 | |a (OCoLC)838123966 |z (OCoLC)1162076894 |z (OCoLC)1200488794 | ||
| 050 | 4 | |a QC787 |b .I6 1989eb | |
| 072 | 7 | |a SCI |x 051000 |2 bisacsh | |
| 082 | 0 | 4 | |a 539.73 |2 22 |
| 084 | |a 33.30 |2 bcl | ||
| 084 | |a 33.46 |2 bcl | ||
| 084 | |a 51.30 |2 bcl | ||
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| 084 | |a WER 770f |2 stub | ||
| 245 | 0 | 0 | |a Ion beams for materials analysis / |c edited by J.R. Bird and J.S. Williams. |
| 260 | |a Sydney ; |a San Diego : |b Academic Press, |c �1989. | ||
| 300 | |a 1 online resource (xviii, 719 pages) : |b illustrations | ||
| 336 | |a text |b txt |2 rdacontent | ||
| 337 | |a computer |b c |2 rdamedia | ||
| 338 | |a online resource |b cr |2 rdacarrier | ||
| 504 | |a Includes bibliographical references and index. | ||
| 505 | 0 | |a Concepts and principles of ion beam analysis / J.S. Williams and J.R. Bird -- Techniques and equipment / M.J. Kenny -- High energy ion scattering spectrometry / J.E.E. Baglin and J.S. Williams -- Nuclear reactions / J.R. Bird -- Ion induced X-ray emission / D.D. Cohen and E. Clayton -- Channeling / J.S. Williams and R.G. Elliman -- Depth profiling of surface layers during ion bombardment / R.J. MacDonald and B.V. King -- Low energy ion scattering from surfaces / D.J. O'Connor and R.J. MacDonald -- Ion scattering from surfaces and interfaces / L.C. Feldman -- Microprobe analysis / G.J.F. Legge -- Critical assessment of analysis capabilities / J.R. Bird and J.S. Williams -- General methods / J.R. Bird and J.S. Williams -- Directory of materials / L. Wielunski, J.R. Bird and J.S. Williams -- Data lists / J.R. Bird et al. | |
| 520 | |a The use of ion beams for materials analysis involves many different ion-atom interaction processes which previously have largely been considered in separate reviews and texts. A list of books and conference proceedings is given in Table 2. This book is divided into three parts, the first which treats all ion beam techniques and their applications in such diverse fields as materials science, thin film and semiconductor technology, surface science, geology, biology, medicine, environmental science, archaeology and so on. | ||
| 588 | 0 | |a Print version record. | |
| 546 | |a English. | ||
| 650 | 0 | |a Ion bombardment. | |
| 650 | 0 | |a Materials |x Analysis. | |
| 650 | 6 | |a Bombardement ionique. |0 (CaQQLa)201-0004234 | |
| 650 | 6 | |a Mat�eriaux |x Analyse. |0 (CaQQLa)201-0297100 | |
| 650 | 7 | |a SCIENCE |x Physics |x Nuclear. |2 bisacsh | |
| 650 | 7 | |a Ion bombardment |2 fast |0 (OCoLC)fst00978567 | |
| 650 | 7 | |a Materials |x Analysis |2 fast |0 (OCoLC)fst01011773 | |
| 650 | 7 | |a Ionenstrahl |2 gnd |0 (DE-588)4162347-2 | |
| 650 | 7 | |a Sekund�arionen-Massenspektrometrie |2 gnd |0 (DE-588)4077346-2 | |
| 650 | 7 | |a Werkstoffpr�ufung |2 gnd |0 (DE-588)4037934-6 | |
| 700 | 1 | |a Bird, J. R. | |
| 700 | 1 | |a Williams, James S. |q (James Stanislaus), |d 1948- | |
| 776 | 0 | 8 | |i Print version: |t Ion beams for materials analysis. |d Sydney ; San Diego : Academic Press, �1989 |z 0120997401 |w (DLC) 86072997 |w (OCoLC)20868099 |
| 856 | 4 | 0 | |u https://sciencedirect.uam.elogim.com/science/book/9780120997404 |z Texto completo |