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Ion beams for materials analysis /

The use of ion beams for materials analysis involves many different ion-atom interaction processes which previously have largely been considered in separate reviews and texts. A list of books and conference proceedings is given in Table 2. This book is divided into three parts, the first which treat...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Otros Autores: Bird, J. R., Williams, James S. (James Stanislaus), 1948-
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Sydney ; San Diego : Academic Press, �1989.
Temas:
Acceso en línea:Texto completo
Descripción
Sumario:The use of ion beams for materials analysis involves many different ion-atom interaction processes which previously have largely been considered in separate reviews and texts. A list of books and conference proceedings is given in Table 2. This book is divided into three parts, the first which treats all ion beam techniques and their applications in such diverse fields as materials science, thin film and semiconductor technology, surface science, geology, biology, medicine, environmental science, archaeology and so on.
Descripción Física:1 online resource (xviii, 719 pages) : illustrations
Bibliografía:Includes bibliographical references and index.
ISBN:9780080916897
0080916899