In-situ characterization of thin film growth /

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Advanced techniques for characterizing thin film growth in situ help to develop improved understanding and faster diagnosis of issues with the process. In situ characterization of thin film growth reviews current and developing techniques for characterizing the growth of thin films, covering an impo...

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Bibliographic Details
Call Number:Libro Electrónico
Other Authors: Koster, Gertjan, 1971-, Rijnders, Guus
Format: Electronic eBook
Language:Inglés
Published: Cambridge ; Philadelphia, PA : Woodhead Pub., 2011.
Series:Woodhead Publishing in materials.
Subjects:
Thin films > Analysis.
Crystal growth.
Couches minces > Analyse.
Cristaux > Croissance.
SCIENCE > Energy.
SCIENCE > Mechanics > General.
SCIENCE > Physics > General.
Crystal growth
Thin films > Analysis
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