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Neutron and X-Ray microscopy Part 2 /
This special volume of Advances in Imaging and Electron Physics details the current theory, experiments, and applications of neutron and x-ray optics and microscopy for an international readership across varying backgrounds and disciplines. Edited by Dr. Ted Cremer, these volumes attempt to provide...
| Cote: | Libro Electrónico |
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| Autres auteurs: | |
| Format: | Électronique eBook |
| Langue: | Inglés |
| Publié: |
Amsterdam :
Academic,
2012.
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| Collection: | Advances in imaging and electron physics ;
v. 173 |
| Sujets: | |
| Accès en ligne: | Texto completo |
| Résumé: | This special volume of Advances in Imaging and Electron Physics details the current theory, experiments, and applications of neutron and x-ray optics and microscopy for an international readership across varying backgrounds and disciplines. Edited by Dr. Ted Cremer, these volumes attempt to provide rapid assimilation of the presented topics that include neutron and x-ray scatter, refraction, diffraction, and reflection and their potential application. Key features: * Contributions from leading authorities * Informs and updates on all the latest developments in the field. |
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| Description matérielle: | 1 online resource (360 pages). |
| ISBN: | 9780123969699 0123969697 |