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110425s1989 enka ob 001 0 eng d |
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|a OCLCE
|b eng
|e pn
|c OCLCE
|d OCLCQ
|d OCLCF
|d OCLCQ
|d OPELS
|d OCLCQ
|d UAB
|d OCLCQ
|d OCLCO
|d OCLCQ
|d OCLCO
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|a 760816147
|a 974615575
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|a 0123538556
|q (electronic bk.)
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|a 9780123538550
|q (electronic bk.)
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|a (OCoLC)714760505
|z (OCoLC)760816147
|z (OCoLC)974615575
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|a dlr
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|a QH212.S3
|b S45 1989
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|a 621.382.3
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|a 621.3815/2
|2 19
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|a SEM microcharacterization of semiconductors /
|c edited by D.B. Holt, D.C. Joy.
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|a S.E.M. microcharacterization of semiconductors
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260 |
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|a London [England] ;
|a San Diego, CA :
|b Academic,
|c �1989.
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300 |
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|a 1 online resource (xiii, 452 pages) :
|b illustrations
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336 |
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|a text
|b txt
|2 rdacontent
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337 |
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|a computer
|b c
|2 rdamedia
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|a online resource
|b cr
|2 rdacarrier
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490 |
1 |
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|a Techniques of physics ;
|v 12
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504 |
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|a Includes bibliographical references and index.
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506 |
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|3 Use copy
|f Restrictions unspecified
|2 star
|5 MiAaHDL
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533 |
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|a Electronic reproduction.
|b [Place of publication not identified] :
|c HathiTrust Digital Library,
|d 2011.
|5 MiAaHDL
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538 |
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|a Master and use copy. Digital master created according to Benchmark for Faithful Digital Reproductions of Monographs and Serials, Version 1. Digital Library Federation, December 2002.
|u http://purl.oclc.org/DLF/benchrepro0212
|5 MiAaHDL
|
583 |
1 |
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|a digitized
|c 2011
|h HathiTrust Digital Library
|l committed to preserve
|2 pda
|5 MiAaHDL
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588 |
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|a Print version record.
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520 |
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|a Applications of SEM techniques of microcharacterization have proliferated to cover every type of material and virtually every branch of science and technology. This book emphasizes the fundamental physical principles. The first section deals with the foundation of microcharacterization in electron beam instruments and the second deals with the interpretation of the information obtained in the main operating modes of a scanning electron microscope.
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|a Semiconductors.
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|a Scanning electron microscopes.
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2 |
|a Semiconductors
|0 (DNLM)D012666
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650 |
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6 |
|a Semi-conducteurs.
|0 (CaQQLa)201-0318258
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650 |
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|a Microscopes �electroniques �a balayage.
|0 (CaQQLa)201-0014916
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650 |
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|a semiconductor.
|2 aat
|0 (CStmoGRI)aat300015117
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650 |
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7 |
|a Scanning electron microscopes
|2 fast
|0 (OCoLC)fst01106478
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650 |
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7 |
|a Semiconductors
|2 fast
|0 (OCoLC)fst01112198
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1 |
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|a Holt, D. B.
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700 |
1 |
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|a Joy, David C.,
|d 1943-
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776 |
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8 |
|i Print version:
|t SEM microcharacterization of semiconductors.
|d London [England] ; San Diego, CA : Academic, �1989
|w (OCoLC)19355053
|
830 |
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0 |
|a Techniques of physics ;
|v 12.
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856 |
4 |
0 |
|u https://sciencedirect.uam.elogim.com/science/book/9780123538550
|z Texto completo
|