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SEM microcharacterization of semiconductors /
Applications of SEM techniques of microcharacterization have proliferated to cover every type of material and virtually every branch of science and technology. This book emphasizes the fundamental physical principles. The first section deals with the foundation of microcharacterization in electron b...
| Clasificación: | Libro Electrónico |
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| Otros Autores: | , |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
London [England] ; San Diego, CA :
Academic,
�1989.
|
| Colección: | Techniques of physics ;
12. |
| Temas: | |
| Acceso en línea: | Texto completo |
| Sumario: | Applications of SEM techniques of microcharacterization have proliferated to cover every type of material and virtually every branch of science and technology. This book emphasizes the fundamental physical principles. The first section deals with the foundation of microcharacterization in electron beam instruments and the second deals with the interpretation of the information obtained in the main operating modes of a scanning electron microscope. |
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| Descripción Física: | 1 online resource (xiii, 452 pages) : illustrations |
| Bibliografía: | Includes bibliographical references and index. |
| ISBN: | 0123538556 9780123538550 |