Trap level spectroscopy in amorphous semiconductors /

Although amorphous semiconductors have been studied for over four decades, many of their properties are not fully understood. This book discusses not only the most used spectroscopic techniques but also describes their advantages and disadvantages. Provides information on the most common spectroscop...

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Bibliographic Details
Call Number:Libro Electrónico
Main Author: Mikla, Victor I.
Format: Electronic eBook
Language:Inglés
Published: Oxford : Elsevier, 2010.
Series:Elsevier insights.
Subjects:
Amorphous semiconductors > Spectra.
Amorphous semiconductors > Defects > Analysis.
Deep level transient spectroscopy.
Semi-conducteurs amorphes > Spectre.
Semi-conducteurs amorphes > D�efauts > Analyse.
Spectroscopie DLTS.
Deep level transient spectroscopy
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