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Semiconductors and semimetals. optical and photothermal characterization / Volume 46, Effect of disorder and defects in ion-implanted semiconductors :

Defects in ion-implanted semiconductors are important and will likely gain increased importance as annealing temperatures are reduced with successive IC generations. Novel implant approaches, such as MdV implantation, create new types of defects whose origin and annealing characteristics will need t...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Otros Autores: Ghibaudo, G�erard, Christofides, Constantinos
Formato: Electrónico eBook
Idioma:Inglés
Publicado: San Diego : Academic Press, �1997.
Colección:Semiconductors and semimetals ; 46.
Temas:
Acceso en línea:Texto completo
Texto completo
Descripción
Sumario:Defects in ion-implanted semiconductors are important and will likely gain increased importance as annealing temperatures are reduced with successive IC generations. Novel implant approaches, such as MdV implantation, create new types of defects whose origin and annealing characteristics will need to be addressed. Publications in this field mainly focus on the effects of ion implantation on the material and the modification in the implanted layer after high temperature annealing. The editors of this volume and Volume 45 focus on the physics of the annealing kinetics of the damaged layer. An overview of characterization tehniques and a critical comparison of the information on annealing kinetics is also presented. Key Features * Provides basic knowledge of ion implantation-induced defects * Focuses on physical mechanisms of defect annealing * Utilizes electrical, physical, and optical characterization tools for processed semiconductors * Provides the basis for understanding the problems caused by the defects generated by implantation and the means for their characterization and elimination.
Descripción Física:1 online resource (xvi, 316 pages) : illustrations
ISBN:0127521461
9780127521466
1281514004
9781281514004
9786611514006
6611514007
0080864430
9780080864433