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Advances in electronics and electron physics. Volume 54 /
ADV ELECTRONICS ELECTRON PHYSICS V54.
| Clasificación: | Libro Electrónico |
|---|---|
| Otros Autores: | , |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
New York ; London :
Academic Press,
�1980.
|
| Colección: | Advances in electronics and electron physics ;
v. 54 |
| Temas: | |
| Acceso en línea: | Texto completo |
Tabla de Contenidos:
- Cover; Contents; Contributors to Volume 54; Foreword; Chapter 1. Magnetic Reconnection Experiments; I. Prolog; II. Introduction; III. Historical Perspective Prior to 1970; IV. Reconnection Theory; V. Reconnection Experiments; VI. Discussion and Conclusions; Appendix I. A Simple Example of an X Point; Appendix II. Reconnection Jargon; Appendix III. Impulsive Flux Transfer and Circuit Transients; References; Chapter 2. Electron Physics in Device Microfabrication. II Electron Resists, X-Ray Lithography, and Electron Beam Lithography Update; I. Introduction
- II. Interactions between a Focused Electron Beam and a Resist-Covered WaferIII. X-Ray Lithography; IV. Recent Work in Electron Beam Lithography; V. The Relative Roles of X-Ray and Electron Beam Lithography Systems with High Throughput; References; Chapter 3. Solar Physics; I. Introduction; II. The Solar Interior; Ill. The Quiet Solar Atmosphere; IV. Solar Activity; References; Chapter 4. Aspects of Resonant Multiphoton Processes; I. Introduction; II. Formal Theory of Multiphoton Processes; III. The Quantum Theory of Resonant Two-Photon Processes; IV. The Effect of Nonresonant States
- V. Higher-Order ProcessesVI. Semiclassical Approaches; VII. Multiple Resonances; VIII. Field Statistics and Bandwidth Effects; IX. Experimental Investigations of Resonant Multiphoton Processes; References; Chapter 5. Fundamentals and Applications of Auger Electron Spectroscopy; I. Introduction; II. Fundamentals; III. Experimental Approach; IV. Quantitative AES; V. Sample Damage; VI. Applications; VII. Summary; References; Author Index; Subject Index