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081026s1980 nyua ob 001 0 eng d |
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|z 49007504
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|a E7B
|b eng
|e pn
|c E7B
|d OCLCQ
|d OPELS
|d OCLCQ
|d OCLCF
|d OCLCQ
|d DEBSZ
|d LEAUB
|d VLY
|d OCLCO
|d OCLCQ
|d OCLCO
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|a 1162222171
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|a 0120146541
|q (electronic bk.)
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|a 9780120146543
|q (electronic bk.)
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|a 9786611411404
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|a 6611411402
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|a 0080577199
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|a 9780080577197
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|a (OCoLC)646754472
|z (OCoLC)1162222171
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|a TK7800
|b .A3754 1980eb
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|a 621.381
|2 23
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|a Advances in electronics and electron physics.
|n Volume 54 /
|c edited by L. Marton and C. Marton.
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260 |
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|a New York ;
|a London :
|b Academic Press,
|c �1980.
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300 |
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|a 1 online resource (xi, 318 pages) :
|b illustrations.
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336 |
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|a text
|b txt
|2 rdacontent
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|a computer
|b c
|2 rdamedia
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|a online resource
|b cr
|2 rdacarrier
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490 |
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|a Advances in electronics and electron physics ;
|v v. 54
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504 |
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|a Includes bibliographical references and index.
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|a Print version record.
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|a Cover; Contents; Contributors to Volume 54; Foreword; Chapter 1. Magnetic Reconnection Experiments; I. Prolog; II. Introduction; III. Historical Perspective Prior to 1970; IV. Reconnection Theory; V. Reconnection Experiments; VI. Discussion and Conclusions; Appendix I. A Simple Example of an X Point; Appendix II. Reconnection Jargon; Appendix III. Impulsive Flux Transfer and Circuit Transients; References; Chapter 2. Electron Physics in Device Microfabrication. II Electron Resists, X-Ray Lithography, and Electron Beam Lithography Update; I. Introduction
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505 |
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|a II. Interactions between a Focused Electron Beam and a Resist-Covered WaferIII. X-Ray Lithography; IV. Recent Work in Electron Beam Lithography; V. The Relative Roles of X-Ray and Electron Beam Lithography Systems with High Throughput; References; Chapter 3. Solar Physics; I. Introduction; II. The Solar Interior; Ill. The Quiet Solar Atmosphere; IV. Solar Activity; References; Chapter 4. Aspects of Resonant Multiphoton Processes; I. Introduction; II. Formal Theory of Multiphoton Processes; III. The Quantum Theory of Resonant Two-Photon Processes; IV. The Effect of Nonresonant States
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505 |
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|a V. Higher-Order ProcessesVI. Semiclassical Approaches; VII. Multiple Resonances; VIII. Field Statistics and Bandwidth Effects; IX. Experimental Investigations of Resonant Multiphoton Processes; References; Chapter 5. Fundamentals and Applications of Auger Electron Spectroscopy; I. Introduction; II. Fundamentals; III. Experimental Approach; IV. Quantitative AES; V. Sample Damage; VI. Applications; VII. Summary; References; Author Index; Subject Index
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520 |
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|a ADV ELECTRONICS ELECTRON PHYSICS V54.
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546 |
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|a English.
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650 |
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|a Electronics.
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650 |
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|a Electron spectroscopy.
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650 |
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2 |
|a Electronics
|0 (DNLM)D004581
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650 |
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6 |
|a �Electronique.
|0 (CaQQLa)201-0001759
|
650 |
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6 |
|a Spectroscopie �electronique.
|0 (CaQQLa)201-0053159
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650 |
|
7 |
|a Electron spectroscopy
|2 fast
|0 (OCoLC)fst00906707
|
650 |
|
7 |
|a Electronics
|2 fast
|0 (OCoLC)fst00907538
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700 |
1 |
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|a Marton, L.
|q (Ladislaus),
|d 1901-
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700 |
1 |
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|a Marton, C.
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776 |
0 |
8 |
|i Print version:
|t Advances in electronics and electron physics.
|d New York ; London : Academic Press, �1980
|w (DLC) 49007504
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856 |
4 |
0 |
|u https://sciencedirect.uam.elogim.com/science/book/9780120146543
|z Texto completo
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