Bowen, W. R., & Hilal, N. (2009). Atomic force microscopy in process engineering: Introduction to AFM for improved processes and products. Butterworth-Heinemann.
Style de citation Chicago (17e éd.)Bowen, W. Richard, et Nidal Hilal. Atomic Force Microscopy in Process Engineering: Introduction to AFM for Improved Processes and Products. Oxford ; Burlington, MA: Butterworth-Heinemann, 2009.
Style de citation MLA (8e éd.)Bowen, W. Richard, et Nidal Hilal. Atomic Force Microscopy in Process Engineering: Introduction to AFM for Improved Processes and Products. Butterworth-Heinemann, 2009.
Attention : ces citations peuvent ne pas être correctes à 100%.