Optics of charged particle analyzers /

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at hig...

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Bibliographic Details
Call Number:Libro Electrónico
Main Author: Yavor, Mikhail
Format: Electronic eBook
Language:Inglés
Published: Amsterdam ; Boston : Academic Press, 2009.
Edition:1st ed.
Series:Advances in imaging and electron physics ; 157.
Subjects:
Particles (Nuclear physics)
Electron optics.
Nuclear physics > Instruments.
Particules (Physique nucl�eaire)
Optique �electronique.
Physique nucl�eaire > Instruments.
particle physics.
SCIENCE > Physics > Nuclear.
SCIENCE > Physics > Atomic & Molecular.
Electron optics
Nuclear physics > Instruments
Online Access:Texto completo
Texto completo
Table of Contents:
  • Charged particles in electromagnetic fields
  • Language of aberration expansions in charged particle optics
  • Transporting charged particle beams in static fields
  • Transporting charged particles in radiofrequency fields
  • Static magnetic charged particle analyzers
  • Electrostatic energy analyzers
  • Mass analyzers with combined electrostatic and magnetic fields
  • Time-of-flight mass analyzers
  • Radiofrequency mass analyzers.

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