Optics of charged particle analyzers /

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at hig...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor principal: Yavor, Mikhail
Formato: Electrónico eBook
Idioma:Inglés
Publicado: Amsterdam ; Boston : Academic Press, 2009.
Edición:1st ed.
Colección:Advances in imaging and electron physics ; 157.
Temas:
Particles (Nuclear physics)
Electron optics.
Nuclear physics > Instruments.
Particules (Physique nucl�eaire)
Optique �electronique.
Physique nucl�eaire > Instruments.
particle physics.
SCIENCE > Physics > Nuclear.
SCIENCE > Physics > Atomic & Molecular.
Electron optics
Nuclear physics > Instruments
Acceso en línea:Texto completo
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Tabla de Contenidos:
  • Charged particles in electromagnetic fields
  • Language of aberration expansions in charged particle optics
  • Transporting charged particle beams in static fields
  • Transporting charged particles in radiofrequency fields
  • Static magnetic charged particle analyzers
  • Electrostatic energy analyzers
  • Mass analyzers with combined electrostatic and magnetic fields
  • Time-of-flight mass analyzers
  • Radiofrequency mass analyzers.

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