Selected problems of computational charged particle optics /

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at hig...

Full description

Bibliographic Details
Call Number:Libro Electrónico
Main Author: Greenfield, Dmitry
Other Authors: Monastyrski�i, M. I. (Mikhail Il�ich)
Format: Electronic eBook
Language:Inglés
Published: Amsterdam ; Boston : Academic Press, 2009.
Edition:1st ed.
Series:Advances in imaging and electron physics ; v. 155.
Subjects:
Electron optics.
Optical data processing.
Aberration.
Optique �electronique.
Traitement optique de l'information.
TECHNOLOGY & ENGINEERING > Imaging Systems.
Aberration
Electron optics
Optical data processing
Online Access:Texto completo
Texto completo
Table of Contents:
  • Integral equations method in electrostatics
  • Surface charge singularities near irregular surface points
  • Geometry perturbations
  • Some aspects of magnetic field simulation
  • Aberration approach and the tau-variation technique
  • Space charge in charged particle bunches
  • General properties of emission-imaging systems
  • Static and time-analyzing image tubes with axial symmetry
  • Spatial and temporal focusing on photoelectron bunches in time-dependent electric fields.

Similar Items