Advances in electronics and electron physics. Volume 37 /
ADVANCES ELECTRONC & ELECTRON PHYSICS V37.
Clasificación: | Libro Electrónico |
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Otros Autores: | |
Formato: | Electrónico eBook |
Idioma: | Inglés |
Publicado: |
New York :
Academic Press,
1975.
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Colección: | Advances in electronics and electron physics ;
v. 37 |
Temas: | |
Acceso en línea: | Texto completo Texto completo |
Tabla de Contenidos:
- Front Cover; Advances in Electronics and Electron Physics, Volume 37; Copyright Page; Contents; Contributors to Volume 37; Foreword; Chapter 1. Intraband Magneto-Optical Studies of Semiconductors in the Far Infrared. I; I. Introduction; II. Theoretical Background; III. Experimental Techniques; IV. Free Carrier Resonances; References; Chapter 2. The Gyrator in Electronic Systems; I. Introduction; II. Reciprocity in Physical Systems; III. The Gyrator as Network Element; IV. Filters; V. Principles of Realization of the Gyrator; VI. Basic Electronic Design; VII. Basic Gyrator Measurements
- VIII. Trends in Gyrator Design and ApplicationsIX. Conclusion; References; Chapter 3. Image Sensors for Solid State Cameras; I. Introduction; II. Photoelements for Self-Scanned Sensors; III. Principles of Multiplexed Scanning in Image Sensors; IV. Early XY Image Sensors; V. Multiplexed Photodiode Arrays; VI. Principles of Scanning by Charge Transfer; VII. Charge-Transfer Sensors Employing Bucket Brigade Registers; VIII. Characteristics of Charge-Coupled Devices (CCD's); IX. Experimental Charge-Coupled Image Sensors; X. Performance Limitations of Charge-Coupled Sensors
- XI. Charge-Transfer Sensors as Analog Signal ProcessorsXII. Self-Scanned Sensors for Color Cameras; XIII. Peripheral Circuits for Solid State Sensors; XIV. Conclusions; References; Chapter 4. Ion Implantation in Semiconductors; I. Introduction; II. Concentration Profiles of Implanted Ions and Defects; III. Enhanced Diffusion; IV. Annealing and Electrical Properties; V. Measurement Technique; VI. Devices; References; Author Index; Subject Index