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Numerical field calculation for charged particle optics /

Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high...

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Detalles Bibliográficos
Clasificación:Libro Electrónico
Autor principal: Kasper, E. (Erwin), 1933-
Formato: Electrónico eBook
Idioma:Inglés
Publicado: San Diego [Calif.] : Academic Press, �2001.
Colección:Advances in imaging and electron physics ; 116.
Temas:
Acceso en línea:Texto completo
Texto completo
Texto completo
Descripción
Sumario:Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Descripción Física:1 online resource (xxiii, 451 pages) : illustrations
Bibliografía:Includes bibliographical references and index.
ISBN:9780080526218
0080526217
0120147580
9780120147588
1281054054
9781281054050
9786611054052
6611054057