Numerical field calculation for charged particle optics /
Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high...
Clasificación: | Libro Electrónico |
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Autor principal: | |
Formato: | Electrónico eBook |
Idioma: | Inglés |
Publicado: |
San Diego [Calif.] :
Academic Press,
�2001.
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Colección: | Advances in imaging and electron physics ;
116. |
Temas: | |
Acceso en línea: | Texto completo Texto completo Texto completo |
Sumario: | Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. |
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Descripción Física: | 1 online resource (xxiii, 451 pages) : illustrations |
Bibliografía: | Includes bibliographical references and index. |
ISBN: | 9780080526218 0080526217 0120147580 9780120147588 1281054054 9781281054050 9786611054052 6611054057 |