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Advances in imaging and electron physics. Volume 134 /
Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high...
| Clasificación: | Libro Electrónico |
|---|---|
| Otros Autores: | |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
Amsterdam ; Boston :
Elsevier Academic Press,
�2005.
|
| Colección: | Advances in imaging and electron physics ;
134. |
| Temas: | |
| Acceso en línea: | Texto completo |
MARC
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| 245 | 0 | 0 | |a Advances in imaging and electron physics. |n Volume 134 / |c edited by Peter W. Hawkes. |
| 260 | |a Amsterdam ; |a Boston : |b Elsevier Academic Press, |c �2005. | ||
| 300 | |a 1 online resource (xvi, 276 pages) : |b illustrations. | ||
| 336 | |a text |b txt |2 rdacontent | ||
| 337 | |a computer |b c |2 rdamedia | ||
| 338 | |a online resource |b cr |2 rdacarrier | ||
| 490 | 1 | |a Advances in imaging and electron physics, |x 1076-5670 ; |v 134 | |
| 504 | |a Includes bibliographical references and index. | ||
| 520 | |a Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. | ||
| 588 | 0 | |a Print version record. | |
| 505 | 0 | |a Front cover; copyright; table of contents; front matter; Contributors; Preface; Future Contributions; body; Circulant Matrix Representation of Feature Masks and Its Applications; Phase Problem and Reference-Beam Diffraction; Fractal Encoding; Morphologically Debiased Classifier Fusion: A Tomography-Theoretic Approach; index. | |
| 650 | 0 | |a Image processing. | |
| 650 | 0 | |a X-ray crystallography. | |
| 650 | 0 | |a Fractals. | |
| 650 | 0 | |a Multisensor data fusion. | |
| 650 | 2 | |a Crystallography, X-Ray |0 (DNLM)D018360 | |
| 650 | 6 | |a Traitement d'images. |0 (CaQQLa)201-0029952 | |
| 650 | 6 | |a Radiocristallographie. |0 (CaQQLa)201-0062582 | |
| 650 | 6 | |a Fractales. |0 (CaQQLa)201-0134451 | |
| 650 | 6 | |a Fusion multicapteurs. |0 (CaQQLa)201-0266002 | |
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| 650 | 7 | |a fractals. |2 aat |0 (CStmoGRI)aat300073497 | |
| 650 | 7 | |a SCIENCE |x Physics |x Electromagnetism. |2 bisacsh | |
| 650 | 7 | |a SCIENCE |x Physics |x Electricity. |2 bisacsh | |
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| 650 | 7 | |a Image processing. |2 fast |0 (OCoLC)fst00967501 | |
| 650 | 7 | |a Multisensor data fusion. |2 fast |0 (OCoLC)fst01029095 | |
| 650 | 7 | |a X-ray crystallography. |2 fast |0 (OCoLC)fst01181820 | |
| 700 | 1 | |a Hawkes, P. W. | |
| 776 | 0 | 8 | |i Print version: |t Advances in imaging and electron physics. Volume 134. |d Amsterdam ; Boston : Elsevier Academic Press, �2005 |z 0120147769 |w (OCoLC)62362121 |
| 830 | 0 | |a Advances in imaging and electron physics ; |v 134. |x 1076-5670 | |
| 856 | 4 | 0 | |u https://sciencedirect.uam.elogim.com/science/book/9780120147762 |z Texto completo |