Advances in imaging and electron physics. Volume 136 /

Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high...

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Bibliographic Details
Call Number:Libro Electrónico
Other Authors: Hawkes, P. W. (Editor)
Format: Electronic eBook
Language:Inglés
Published: Amsterdam ; Boston : Elsevier Academic Press, �2005.
Series:Advances in imaging and electron physics ; 136.
Subjects:
Image processing.
Electron microscopy.
Traitement d'images.
Microscopie �electronique.
image processing.
electron microscopy.
SCIENCE > Physics > Electromagnetism.
SCIENCE > Physics > Electricity.
Electron microscopy
Image processing
Online Access:Texto completo
Table of Contents:
  • Front cover; copyright; table of contents; front matter; Contributors; Preface; Future Contributions; body; Real and Complex PDE-Based Schemes for Image Sharpening and Enhancement; The S-State Model for Electron Channeling in High-Resolution Electron Microscopy; Measurement of Electric Fields on Object Surface in an Emission Electron Microscope; Index.

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