X-ray diffraction : modern experimental techniques /
High-resolution x-ray diffraction and scattering is a key tool for structure analysis not only in bulk materials but also at surfaces and buried interfaces from the sub-nanometer range to micrometers. This book offers an overview of diffraction and scattering methods currently available at modern sy...
Clasificación: | Libro Electrónico |
---|---|
Otros Autores: | Seeck, Oliver H., 1966- (Editor ), Murphy, Bridget M., 1969- (Editor ) |
Formato: | Electrónico eBook |
Idioma: | Inglés |
Publicado: |
[Singapore] :
Pan Stanford Publishing,
[2014]
|
Temas: | |
Acceso en línea: | Texto completo (Requiere registro previo con correo institucional) |
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