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Testing for small-delay defects in nanoscale CMOS integrated circuits /
Advances in design methods and process technologies have resulted in a continuous increase in the complexity of integrated circuits (ICs). However, the increased complexity and nanometer-size features of modern ICs make them susceptible to manufacturing defects, as well as performance and quality is...
| Call Number: | Libro Electrónico |
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| Other Authors: | , |
| Format: | Electronic eBook |
| Language: | Inglés |
| Published: |
Boca Raton :
CRC Press, Taylor & Francis Group,
[2014]
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| Series: | Devices, circuits, and systems.
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| Subjects: | |
| Online Access: | Texto completo (Requiere registro previo con correo institucional) |