Style de citation APA (7e éd.)

Goel, S. K., & Chakrabarty, K. (2014). Testing for small-delay defects in nanoscale CMOS integrated circuits. CRC Press, Taylor & Francis Group.

Style de citation Chicago (17e éd.)

Goel, Sandeep K., et Krishnendu Chakrabarty. Testing for Small-delay Defects in Nanoscale CMOS Integrated Circuits. Boca Raton: CRC Press, Taylor & Francis Group, 2014.

Style de citation MLA (8e éd.)

Goel, Sandeep K., et Krishnendu Chakrabarty. Testing for Small-delay Defects in Nanoscale CMOS Integrated Circuits. CRC Press, Taylor & Francis Group, 2014.