Cita APA (7a ed.)

Goel, S. K., & Chakrabarty, K. (2014). Testing for small-delay defects in nanoscale CMOS integrated circuits. CRC Press, Taylor & Francis Group.

Cita Chicago Style (17a ed.)

Goel, Sandeep K., y Krishnendu Chakrabarty. Testing for Small-delay Defects in Nanoscale CMOS Integrated Circuits. Boca Raton: CRC Press, Taylor & Francis Group, 2014.

Cita MLA (8a ed.)

Goel, Sandeep K., y Krishnendu Chakrabarty. Testing for Small-delay Defects in Nanoscale CMOS Integrated Circuits. CRC Press, Taylor & Francis Group, 2014.