APA (7th ed.) Citation

Goel, S. K., & Chakrabarty, K. (2014). Testing for small-delay defects in nanoscale CMOS integrated circuits. CRC Press, Taylor & Francis Group.

Chicago Style (17th ed.) Citation

Goel, Sandeep K., and Krishnendu Chakrabarty. Testing for Small-delay Defects in Nanoscale CMOS Integrated Circuits. Boca Raton: CRC Press, Taylor & Francis Group, 2014.

MLA (8th ed.) Citation

Goel, Sandeep K., and Krishnendu Chakrabarty. Testing for Small-delay Defects in Nanoscale CMOS Integrated Circuits. CRC Press, Taylor & Francis Group, 2014.