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Fault diagnosis for robust inverter power drives /
This book deals with the concept that the specification of a power component needs a life expectancy associated with other important factors, to allow the appropriate component selection when designing robust and reliable systems. An analysis of the fundamental physics of aging in power drive compon...
| Clasificación: | Libro Electrónico |
|---|---|
| Otros Autores: | |
| Formato: | Electrónico eBook |
| Idioma: | Inglés |
| Publicado: |
London :
Institution of Engineering and Technology,
2018.
|
| Colección: | IET energy engineering series ;
120. |
| Temas: | |
| Acceso en línea: | Texto completo |
MARC
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| 020 | |a 9781785614118 |q (electronic bk.) | ||
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| 245 | 0 | 0 | |a Fault diagnosis for robust inverter power drives / |c edited by Antonio Ginart. |
| 264 | 1 | |a London : |b Institution of Engineering and Technology, |c 2018. | |
| 264 | 4 | |c ©2019 | |
| 300 | |a 1 online resource (xi, 304 pages) : |b illustrations | ||
| 336 | |a text |b txt |2 rdacontent | ||
| 337 | |a computer |b c |2 rdamedia | ||
| 338 | |a online resource |b cr |2 rdacarrier | ||
| 490 | 1 | |a IET energy engineering ; |v 120 | |
| 588 | 0 | |a Print version record. | |
| 504 | |a Includes bibliographical references and index. | ||
| 520 | |a This book deals with the concept that the specification of a power component needs a life expectancy associated with other important factors, to allow the appropriate component selection when designing robust and reliable systems. An analysis of the fundamental physics of aging in power drive components and the markers that diagnose the process towards failure is presented to illustrate to the reader state-of-the-art approaches to increase reliability. Amongst the many factors playing an important role in designing a robust power drive, the main factor deals with how long the power drive will last at the conditions in which it will be operating. In particular, the book looks at invertor power drive reliability and diagnosis; power semiconductors, SiC, GaN, MOSFETs and IGBTs; DC-link capacitors; embedded fault diagnosis and prognosis; fault tolerance strategies for power convertors; motor diagnostics and protection using invertor capabilities; battery storage; prognostics with a particular application to a battery. | ||
| 505 | 0 | |a Intro; Contents; Preface; 1. Fundamentals for reliability and early diagnosis for inverter power drives / José Manuel Aller, Antonio Ginart, and George Vachtsevanos; 1.1 Introduction; 1.1.1 Manufacture defects (early failure); 1.1.2 Random failure; 1.1.3 Wear-out failure; 1.2 Statistical life estimation and failure rate: the bathtub curve; 1.2.1 Reliability R(t) and unreliability F(t) functions; 1.2.2 Probability density function and medium time before failure; 1.2.3 Failure rate function; 1.2.4 Exponential distribution; 1.2.5 Weibull distribution | |
| 505 | 8 | |a 1.3 Degradation, failure mechanisms, and life model estimation1.3.1 Solid-stare materials; 1.3.2 Failure modes and physics-based life model calculation; 1.4 Inverters failure and power drives; 1.5 Circuit with ideal switches: power switches fundamentals; 1.6 PWM, the enabler of power electronics; 1.7 Switching under RL circuit load; 1.8 RLC circuit; 1.8.1 Series RLC model; 1.8.2 Shunt RLC model; 1.9 PWM in inverters; 1.10 Inverter basic operation; 1.11 Three-phase and multilevel inverters; 1.12 Operation principle of multilevel inverters; 1.13 Dominant topology; 1.14 Resonant converters | |
| 505 | 8 | |a 1.15 Real switches: power losses in hard switching1.15.1 Conduction losses; 1.15.2 Switching losses; 1.16 Thermal consideration; 1.16.1 State modeling of the thermal system; 1.16.2 Thermal runaway; References; 2. Early diagnosis in power semiconductors: MOSFET, IGBT, emerging materials (SiC and GaNs) / Antonio Ginart, José M. Aller, and George J. Vachtsevanos; 2.1 Introduction; 2.1.1 Power device stress factors; 2.1.2 Silicon power MOSFET structure and parasitics; 2.1.3 SiC power MOSFET structure and parasitics; 2.1.4 GaNs structure and parasitics; 2.1.5 IGBT structure and latch-up | |
| 505 | 8 | |a 2.2 Switching process in semiconductors2.2.1 Field distortion acceleration model; 2.3 Relevant indicators in power semiconductors; 2.3.1 Voltage Vth and capacitance shift; 2.3.2 Ringing characterization and turn-on delay; 2.3.3 Detachment and wire bond fatigue; 2.3.4 Junction temperature of power semiconductor; References; 3. Early diagnosis in DC-link capacitors: electrolytic and films / Chetan Kulkarni, José Celaya, and Kai Goebel; 3.1 Introduction; 3.1.1 Research challenges; 3.1.2 Organization; 3.2 Modeling for prognostics; 3.3 Research methodology | |
| 505 | 8 | |a 3.4 Degradation in electrolytic capacitors3.4.1 Degradation mechanisms; 3.4.2 Capacitor degradation models; 3.4.3 Physics-based models for C and ESR; 3.4.4 Time-dependent degradation models; 3.5 Model-based prognostics framework; 3.5.1 Kalman filter for state estimation; 3.5.2 Future state forecasting; 3.5.3 Noise models; 3.5.4 Prognostics problem formulation; 3.5.5 Physics-based modeling framework using unscented Kalman filter; 3.6 Accelerated aging experiments; 3.6.1 Experimental setup; 3.6.2 Electrical overstress; 3.6.3 EOS experiment | |
| 590 | |a Knovel |b ACADEMIC - Electronics & Semiconductors | ||
| 650 | 0 | |a Electric inverters. | |
| 650 | 0 | |a Electric fault location. | |
| 650 | 0 | |a Fault tolerance (Engineering) | |
| 650 | 6 | |a Onduleurs (Électricité) | |
| 650 | 6 | |a Défauts électriques |x Localisation. | |
| 650 | 6 | |a Tolérance aux fautes (Ingénierie) | |
| 650 | 7 | |a TECHNOLOGY & ENGINEERING |x Mechanical. |2 bisacsh | |
| 650 | 7 | |a Electric fault location |2 fast | |
| 650 | 7 | |a Electric inverters |2 fast | |
| 650 | 7 | |a Fault tolerance (Engineering) |2 fast | |
| 650 | 7 | |a cells (electric) |2 inspect | |
| 650 | 7 | |a electric drives. |2 inspect | |
| 650 | 7 | |a electric motors. |2 inspect | |
| 650 | 7 | |a fault diagnosis. |2 inspect | |
| 650 | 7 | |a fault tolerance. |2 inspect | |
| 650 | 7 | |a invertors. |2 inspect | |
| 650 | 7 | |a power capacitors. |2 inspect | |
| 650 | 7 | |a power semiconductor devices. |2 inspect | |
| 650 | 7 | |a semiconductor device reliability. |2 inspect | |
| 700 | 1 | |a Ginart, Antonio, |e editor. | |
| 710 | 2 | |a Institution of Engineering and Technology, |e publisher. | |
| 776 | 0 | 8 | |i Print version: |t Fault diagnosis for robust inverter power drives. |d London : Institution of Engineering and Technology, 2018 |z 9781785614101 |w (OCoLC)1079438064 |
| 830 | 0 | |a IET energy engineering series ; |v 120. | |
| 856 | 4 | 0 | |u https://appknovel.uam.elogim.com/kn/resources/kpFDRIPD03/toc |z Texto completo |
| 938 | |a Askews and Holts Library Services |b ASKH |n AH34796305 | ||
| 938 | |a ProQuest Ebook Central |b EBLB |n EBL5667530 | ||
| 938 | |a EBSCOhost |b EBSC |n 2005065 | ||
| 938 | |a YBP Library Services |b YANK |n 16007799 | ||
| 994 | |a 92 |b IZTAP | ||