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ISTFA 2017 : conference proceedings from the 43rd International Symposium for Testing and Failure Analysis : November 5-9, 2017, Pasadena Convention Center, Pasadena, California, USA /

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Détails bibliographiques
Cote:	Libro Electrónico
Collectivités auteurs:	International Symposium for Testing and Failure Analysis Fort Worth, Tex., ASM International, Electronic Device Failure Analysis Society
Format:	Électronique Actes de congrès eBook
Langue:	Inglés
Publié:	Materials Park, Ohio : ASM International, ©2017.
Sujets:	Electronics > Materials > Testing > Congresses. Electronic apparatus and appliances > Testing > Congresses. Appareils électroniques > Essais > Congrès. TECHNOLOGY & ENGINEERING > Mechanical. Electronic apparatus and appliances > Testing Electronics > Materials > Testing Conference papers and proceedings
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