ISTFA 2017 : conference proceedings from the 43rd International Symposium for Testing and Failure Analysis : November 5-9, 2017, Pasadena Convention Center, Pasadena, California, USA /

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Détails bibliographiques
Cote:Libro Electrónico
Collectivités auteurs: International Symposium for Testing and Failure Analysis Fort Worth, Tex., ASM International, Electronic Device Failure Analysis Society
Format: Électronique Actes de congrès eBook
Langue:Inglés
Publié: Materials Park, Ohio : ASM International, ©2017.
Sujets:
Electronics > Materials > Testing > Congresses.
Electronic apparatus and appliances > Testing > Congresses.
Appareils électroniques > Essais > Congrès.
TECHNOLOGY & ENGINEERING > Mechanical.
Electronic apparatus and appliances > Testing
Electronics > Materials > Testing
Conference papers and proceedings
Accès en ligne:Texto completo
Description
Description matérielle:1 online resource (665 pages)
Bibliographie:Includes bibliographical references and index.
ISBN:9781627081511
1627081518

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