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180314s2018 waua ob 001 0 eng d |
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|a SPIES
|b eng
|e rda
|e pn
|c SPIES
|d OCLCO
|d OCLCQ
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|a 1036293546
|a 1162136610
|a 1231613579
|a 1244635342
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|a 1510617388
|q (pdf)
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|a 9781510617384
|q (electronic bk.)
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|z 9781510617377
|q (softcover)
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|z 151061737X
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024 |
7 |
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|a 10.1117/3.2314953
|2 doi
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035 |
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|a (OCoLC)1028853536
|z (OCoLC)1036293546
|z (OCoLC)1162136610
|z (OCoLC)1231613579
|z (OCoLC)1244635342
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050 |
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|a QC355.3
|b .Y456 2018eb
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0 |
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|a 535
|2 23
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|a UAMI
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100 |
1 |
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|a Yen, Anthony,
|e author.
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1 |
0 |
|a Optical physics for nanolithography /
|c Anthony Yen, Shinn-Sheng Yu.
|
264 |
|
1 |
|a Bellingham, Washington (1000 20th St. Bellingham WA 98225-6705 USA) :
|b SPIE,
|c 2018.
|
300 |
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|a 1 online resource (352 pages) :
|b color illustrations
|
336 |
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|a text
|b txt
|2 rdacontent
|
337 |
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|a computer
|b c
|2 rdamedia
|
338 |
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|a online resource
|b cr
|2 rdacarrier
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490 |
1 |
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|a SPIE Press monograph ;
|v PM284
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504 |
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|a Includes bibliographical references and index.
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505 |
0 |
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|a Preface -- Notations and conventions -- 1. Mathematical preliminaries: 1.1. Mean-value theorems of integral calculus; 1.2. The delta function; 1.3. Weierstrass' approximation theorem; 1.4. Fourier transform; 1.5. Vector algebra; 1.6. Vector calculus; 1.7. Curvilinear coordinates; 1.8. Solution to Poisson's equation; 1.9. Helmholtz's theorem -- 2. Electromagnetic waves in free space: 2.1. Maxwell's equations in free space; 2.2. Electromagnetic radiation; 2.3. Systematic solution of inhomogeneous wave equations with boundary and initial conditions; 2.4. Solution inhomogeneous wave equations with harmonic time dependence -- 3. Electromagnetic waves in material media: 3.1. Macroscopic fields in material media; 3.2. Energy in electromagnetic fields; 3.3. Hertz vectors; 3.4. Fields of an electric dipole; 3.5. Dielectric properties of matter; 3.6. Physical origin of reflection and transmission; Ewald-Oseen extinction theorem; 3.7. Reflection and transmission upon incidence on a multilayer stack -- 4. Elements of geometrical optics: 4.1. Geometrical wavefronts and light rays; 4.2. Fermat's principle; 4.3. The characteristic functions of Hamilton; 4.4. The sine condition; 4.5. The Herschel condition; 4.6. The paraxial approximation; 4.7. The Smith-Helmholtz invariant; 4.8. The thin lens formula; 4.9. Stops, pupils, and windows; 4.10. Chief and marginal rays; meridional, tangential, and sagittal planes; meridional and skew rays.
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505 |
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|a 5. Diffraction of electromagnetic waves: 5.1. The scalar theory of diffraction; 5.2. Fresnel and Fraunhofer approximations; 5.3. Representation of the diffracted field by the angular spectrum of plane waves; 5.4. The vector theory of diffraction -- 6. Image formation in an optical system: 6.1. Heuristic imaging theory; 6.2. The lithographic imaging system; 6.3. Imaging by a point source: coherent imaging; 6.4. Imaging by an extended source: partially coherent imaging; 6.5. Yamazoe's stacked shifted pupil formulation; 6.6. Imaging with a higher numerical aperture: radiometric correction; 6.7. 3-D point spread function; 6.8. Imaging with a higher numerical aperture: polarization effect -- 7. Aberrations in optical imaging systems: 7.1. Design of aspherical surfaces; 7.2. Connection between ray and wave aberrations; 7.3. The wave aberration for rotationally symmetric optical systems: Seidel aberrations; 7.4. General form of the aberration function for rotationally symmetric optical systems; 7.5. Digression: Gram-Schmidt orthogonalization process and orthogonal polynomials; 7.6. Orthogonal polynomials for expanding the aberration function: Zernike polynomials -- Index.
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520 |
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|a This book provides an in-depth, self-contained introduction of partially coherent imaging theory for researchers and engineers working on optical lithography for semiconductor manufacturing, including those in the EDA industry. It is mathematically complete: the opening chapters discuss the essential principles, and all derivations are presented with their intermediate steps. For increased accessibility, simplified and consistent notations are used throughout the text. Full-color pages illustrate the connections between figures and equations.
|
590 |
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|a Knovel
|b ACADEMIC - Optics & Photonics
|
590 |
|
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|a Knovel
|b ACADEMIC - Chemistry & Chemical Engineering
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650 |
|
0 |
|a Optics.
|
650 |
|
0 |
|a Imaging systems.
|
650 |
|
0 |
|a Nanolithography.
|
650 |
|
6 |
|a Optique.
|
650 |
|
6 |
|a Imagerie (Technique)
|
650 |
|
6 |
|a Nanolithographie.
|
650 |
|
7 |
|a optics.
|2 aat
|
650 |
|
7 |
|a Imaging systems.
|2 fast
|0 (OCoLC)fst00967605
|
650 |
|
7 |
|a Nanolithography.
|2 fast
|0 (OCoLC)fst01894717
|
650 |
|
7 |
|a Optics.
|2 fast
|0 (OCoLC)fst01046845
|
700 |
1 |
|
|a Yu, Shinn-Sheng,
|e author.
|
710 |
2 |
|
|a Society of Photo-optical Instrumentation Engineers,
|e publisher.
|
776 |
0 |
8 |
|i Print version:
|z 151061737X
|z 9781510617377
|w (DLC) 2018930737
|
830 |
|
0 |
|a SPIE Press monograph ;
|v PM284.
|
856 |
4 |
0 |
|u https://appknovel.uam.elogim.com/kn/resources/kpOPN00002/toc
|z Texto completo
|
938 |
|
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|a Society of Photo-Optical Instrumentation Engineers
|b SPIE
|n 9781510617384
|
938 |
|
|
|a YBP Library Services
|b YANK
|n 15357756
|
938 |
|
|
|a EBSCOhost
|b EBSC
|n 1808525
|
994 |
|
|
|a 92
|b IZTAP
|